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Scalable fault tolerant architecture for complex event processing systems

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dc.contributor.author Randika, HC
dc.contributor.author Martin, HE
dc.contributor.author Sampath, DMRR
dc.contributor.author Metihakwala, DS
dc.contributor.author Sarveswaren, K
dc.contributor.author Wijekoon, M
dc.contributor.editor Gunasekara, C
dc.contributor.editor Wijegunawardana, P
dc.contributor.editor Pavalanathan, U
dc.date.accessioned 2022-12-06T05:42:53Z
dc.date.available 2022-12-06T05:42:53Z
dc.date.issued 2010-09
dc.identifier.citation ****** en_US
dc.identifier.uri http://dl.lib.uom.lk/handle/123/19678
dc.description.abstract Complex Event Processing (CEP) is one of the emerging areas in computer science and it is being heavily used in real time systems during the recent times. CEP systems should be scalable and fault tolerant. The research project epZilla is to build a scalable, highly available and fault-tolerant distributed architecture for CEP systems. Software Transactional Memory, Leader Election algorithms, dynamic load balancing, dynamic service discovery, Stratification are the concepts which are used to build the proposed architecture. The results of the pilot run are promising and show that the proposed architecture is scalable and fault tolerant. en_US
dc.language.iso en en_US
dc.publisher Computer Science & Engineering Society c/o Department of Computer Science and Engineering, University of Moratuwa. en_US
dc.subject Stratification en_US
dc.subject CEP en_US
dc.subject Distributed Systems en_US
dc.subject Dynamic Discovery en_US
dc.subject STM en_US
dc.title Scalable fault tolerant architecture for complex event processing systems en_US
dc.type Conference-Full-text en_US
dc.identifier.faculty Engineering en_US
dc.identifier.department Department of Computer Science and Engineering en_US
dc.identifier.year 2010 en_US
dc.identifier.conference CS & ES Conference 2010 en_US
dc.identifier.place Moratuwa. Sri Lanka en_US
dc.identifier.pgnos pp. 117-127 en_US
dc.identifier.proceeding Proceedings of the CS & ES Conference 2010 en_US


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