dc.contributor.author |
Wickramasinghe, P |
|
dc.contributor.author |
Jayawardane, VPT |
|
dc.date.accessioned |
2023-01-05T08:25:14Z |
|
dc.date.available |
2023-01-05T08:25:14Z |
|
dc.date.issued |
2022-12-01 |
|
dc.identifier.uri |
http://dl.lib.uom.lk/handle/123/20106 |
|
dc.description.abstract |
This research investigates the work from home impacts on interns in the IT industry. It will be necessary for both academic parties and organizations in the IT industries to identify the areas that need to be focused on and to adjust their policies according to the virtual internships. Therefore, this research aims to study the impact on the interns in the IT industry with the work-from-home (WFH) model and to what extent they are satisfied with their internship while WFH. This analysis is based on quantitative methodology, and it includes a series of questions that request to know their opinion using a five-point Likert scale ranging from strongly disagree to agree strongly. This questionnaire measured independent variables, faculty mentor's preparedness, internet efficiency, industry mentor's preparedness, intern readiness, home working environment, and inters' satisfaction with the internship program. |
en_US |
dc.language.iso |
en |
en_US |
dc.publisher |
Business Research Unit (BRU) |
en_US |
dc.subject |
Information technology |
en_US |
dc.subject |
Work-from-home |
en_US |
dc.subject |
Internship |
en_US |
dc.subject |
Intern satisfaction |
en_US |
dc.title |
The Impacts of the work-from-home model on interns’ satisfaction in the information technology industry during the covid-19 |
en_US |
dc.type |
Conference-Full-text |
en_US |
dc.identifier.year |
2022 |
en_US |
dc.identifier.conference |
International Conference on Business Research |
en_US |
dc.identifier.place |
Moratuwa |
en_US |
dc.identifier.pgnos |
pp. 293-309 |
en_US |
dc.identifier.proceeding |
5th International Conference on Business Research |
en_US |
dc.identifier.email |
panchalidewmini@gmail.com |
en_US |
dc.identifier.email |
thesaraj@uom.lk |
en_US |